Quality Assurance

 

Every Newport Digital memory card is thoroughly tested in order to provide the highest quality and reliability. The Newport Digital testing methodology consists of functional tests and burn-in (stress) tests. The functional tests provide about 96% fault coverage in a short period of time. After passing functional tests, the memory products are subjected to burn-in tests in the actual HP system. The burn-in tests exercise the memory with a comprehensive set of patterns that subject the memory to a wide range of address, data, and timing schemes. These stress tests are used to find faults that arise during the infant mortality period. The final result is a memory product with the highest possible reliability.